arxivcs.CV2026-07-06
ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing
Wei Sun, Weixia Zhang, Linhan Cao, Mingkai Lu, Xiongkuo Min, Xiaoping Zhang, et al.
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial…