arxivcs.CVcs.LG2026-07-15
XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation
Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy, Imtiaz Ahmed, Jeremy Dawson, Srinjoy Das
Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across scan conditions. Although recent foundation models such as the Segment Anything Model (SAM) provide str…