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Jun Xie

2 papers indexed

crossrefElectronics2023-10-17Cited by 1

Deep Learning Neural Network-Based Detection of Wafer Marking Character Recognition in Complex Backgrounds

Yufan Zhao, Jun Xie, Peiyu He

Wafer characters are used to record the transfer of important information in industrial production and inspection. Wafer character recognition is usually used in the traditional template matching method. However, the accuracy and robustness of the template matching method for det…

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