openalexnpj Computational Materials2026-07-27
Improving atomic force microscopy structure discovery via style-translation
Jie Huang, Niko Oinonen, Fabio Priante, Filippo Federici Canova, Lauri Kurki, Chen Xu, et al.
Abstract Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the probe particle model provide a cost-effective approach for rapid AFM…