Prashanthi Metku

Formal Foundations for Known Good Reliable Die Screening in Chiplet-Based AI Systems-on-Chip

Prashanthi Metku, Chandra Gandu

The rapid growth of chiplet-based artificial intelligence systems-on-chip (SoCs) has exposed a fundamental gap in semiconductor test methodology. Existing Known Good Die (KGD) screening guarantees pre-assembly functional correctness, yet it offers no probabilistic assurance of po…Read more