Saleh Mulhem

SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow

Andrija Nešković, Christian Ewert, Mladen Berekovic, Saleh Mulhem

Power-Side-Channel Leakage (PSCL) originates from architectural and micro-architectural artifacts in a processor and poses a severe threat to the confidentiality of cryptographic software. Consequently, pre-silicon PSCL evaluation is indispensable for secure hardware design. Exis…Read more