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crossrefElectronics2025-03-28Cited by 5

Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once

Dongsik Kim, Jinho Kang

As the rapid expansion of future mobility systems increases, along with the demand for fast and accurate X-ray security inspections, deep neural network (DNN)-based systems have gained significant attention for detecting prohibited items by constructing high-quality datasets and enhancing detection performance. While Generative AI has been widely explored across various fields, its application in DNN-based X-ray security inspection remains largely underexplored. The accessibility of commercial Generative AI raises safety concerns about the creation of new prohibited items, highlighting the need to integrate synthetic X-ray images into DNN training to improve detection performance, adapt to emerging threats, and investigate its impact on object detection. To address this, we propose a novel machine learning framework that enhances DNN-based X-ray security inspection by integrating real-world X-ray images with Generative AI images utilizing a commercial text-to-image model, improving dataset diversity and detection accuracy. Our proposed framework provides an effective solution to mitigate potential security threats posed by Generative AI, significantly improving the reliability of DNN-based X-ray security inspection systems, as verified through comprehensive evaluations.

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crossrefElectronics2024-11-21Cited by 9

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crossrefElectronics2024-11-20

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crossrefElectronics2024-05-02Cited by 12

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