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Óscar Hernández-Uribe

1 paper indexed

crossrefMachine Learning and Knowledge Extraction2025-12-27Cited by 1

Deep Learning Algorithms for Defect Detection on Electronic Assemblies: A Systematic Literature Review

Bernardo Montoya Magaña, Óscar Hernández-Uribe, Leonor Adriana Cárdenas-Robledo, Jose Antonio Cantoral-Ceballos

The electronic manufacturing industry is relying on automatic and rapid defect inspection of printed circuit boards (PCBs). Two main challenges hinder the accuracy and real-time defect detection: the growing density of electronic component placement and their size reduction, comp…

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