Deep Learning Algorithms for Defect Detection on Electronic Assemblies: A Systematic Literature Review

Bernardo Montoya Magaña, Óscar Hernández-Uribe, Leonor Adriana Cárdenas-Robledo, Jose Antonio Cantoral-Ceballos

The electronic manufacturing industry is relying on automatic and rapid defect inspection of printed circuit boards (PCBs). Two main challenges hinder the accuracy and real-time defect detection: the growing density of electronic component placement and their size reduction, complicating the identification of tiny defects. This systematic review encompasses 56 relevant articles from the Scopus database between 2015 and the first quarter of 2025. This study examines deep learning (DL) architectures and machine learning (ML) algorithms for defect detection in PCB manufacturing. Findings indicate that 78.6% of the articles used models capable of detecting up to six defect types, and 62.5% relied on custom-made datasets. Convolutional neural networks (CNNs) are commonly utilized architectures due to their flexibility and adaptability to a variety of tasks. Still, real-time defect detection remains a challenge because of the complexity and high throughput in production settings. Likewise, accessible datasets are essential for the electronics industry to achieve broad adoption. Hence, architectures capable of learning and optimizing directly in the production line from unlabeled PCB data, without prior training, are necessary.