semantic_scholarIEEE Journal of Solid-State Circuits2026-08-01
A Modular Ring-Oscillator Array Chip for Accurate Stress Testing of CMOS Aging Mechanisms
J. Diaz-Fortuny, E. Bury, R. Degraeve, B. Kaczer
Ring-oscillator (RO) circuits have historically been used to characterize the performance of CMOS technologies, as they can easily expose both process variability and aging through a straightforward circuit structure. ROs are widely employed to study degradation mechanisms such a…