semantic_scholarMicro and Nano Engineering
Mitigating the degradation of metal–semiconductor contacts with optimized electron beam evaporation
T. Frahm, P. Liebisch, Jochen Heiss, S. Ingebrandt, J. Knoch
1 paper indexed
T. Frahm, P. Liebisch, Jochen Heiss, S. Ingebrandt, J. Knoch