Local Field-Scale Winter Wheat Yield Prediction Using VENµS Satellite Imagery and Machine Learning Techniques

Marco Spencer Chiu, Jinfei Wang

Reliable and accurate crop yield prediction at the field scale is critical for meeting the global demand for reliable food sources. In this study, we tested the viability of VENμS satellite data as an alternative to other popular and publicly available multispectral satellite data to predict winter wheat yield and produce a yield prediction map for a field located in southwestern Ontario, Canada, in 2020. Random forest (RF) and support vector regression (SVR) were the two machine learning techniques employed. Our results indicate that machine learning models paired with vegetation indices (VIs) derived from VENμS imagery can accurately predict winter wheat yield 1~2 months prior to harvest, with the most accurate predictions achieved during the early fruit development stage. While both machine learning approaches were viable, SVR produced the most accurate prediction with an R2 of 0.86 and an RMSE of 0.3925 t/ha using data collected from tillering to the early fruit development stage. NDRE-1, NDRE-2, and REP from various growth stages were ranked among the top seven variables in terms of importance for the prediction. These findings provide valuable insights into using high-resolution satellites as tools for non-destructive yield potential analysis.