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semantic_scholarIEEE Journal of Solid-State Circuits2026-08-01

A Modular Ring-Oscillator Array Chip for Accurate Stress Testing of CMOS Aging Mechanisms

J. Diaz-Fortuny, E. Bury, R. Degraeve, B. Kaczer

Ring-oscillator (RO) circuits have historically been used to characterize the performance of CMOS technologies, as they can easily expose both process variability and aging through a straightforward circuit structure. ROs are widely employed to study degradation mechanisms such a…

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